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Single crystal silicon carbide detector of emitted ions and soft x rays from power laser-generated plasmas
53
Citations
8
References
2009
Year
Electrical EngineeringEngineeringPhysicsLaser-induced BreakdownSoft X RaysApplied PhysicsEmitted IonsSingle-crystal Silicon CarbideMean EnergyLaser Plasma PhysicSic SurfaceIon BeamInstrumentationSynchrotron RadiationPower Laser-generated PlasmasX-ray Free-electron LaserIon Emission
A single-crystal silicon carbide (SiC) detector was used for measurements of soft x rays, electrons, and ion emission from laser-generated plasma obtained with the use of the Prague Asterix Laser System (PALS) at intensities of the order of 1016 W/cm2 and pulse duration of 300 ps. Measurements were performed by varying the laser intensity and the nature of the irradiated target. The spectra obtained by using the SiC detector show not only the photopeak due to UV and soft x-ray detection, but also various peaks due to the detection of energetic charged particles. Time-of-flight technique was employed to determine the ion kinetic energy of particles emitted from the plasma and to perform a comparison between SiC and traditional ion collectors. The detector was also employed by inserting absorber films of different thickness in front of the SiC surface in order to determine, as a first approximation, the mean energy of the soft x-ray emission from the plasma.
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