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Point of zero charge of a corundum-water interface probed with optical second harmonic generation (SHG) and atomic force microscopy (AFM): New approaches to oxide surface charge

Materials ScienceCorundum-water InterfaceAtomic Force MicroscopyEngineeringMicroscopyScanning Probe MicroscopySurface ScienceApplied PhysicsScanning Force MicroscopyInterfacial PhenomenaSurface Charge