Characterization of Polystyrene on Etched Silver Using Ion Scattering and X-ray Photoelectron Spectroscopy: Correlation of Secondary Ion Yield in Time-of-Flight SIMS with Surface Coverage

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ADVERTISEMENT RETURN TO ISSUEPREVArticleNEXTCharacterization of Polystyrene on Etched Silver Using Ion Scattering and X-ray Photoelectron Spectroscopy: Correlation of Secondary Ion Yield in Time-of-Flight SIMS with Surface CoverageDavid C. Muddiman, Adam H. Brockman, Andrew Proctor, Marwan Houalla, and David M. HerculesCite this: J. Phys. Chem. 1994, 98, 44, 11570–11575Publication Date (Print):November 1, 1994Publication History Published online1 May 2002Published inissue 1 November 1994https://doi.org/10.1021/j100095a044RIGHTS & PERMISSIONSArticle Views111Altmetric-Citations29LEARN ABOUT THESE METRICSArticle Views are the COUNTER-compliant sum of full text article downloads since November 2008 (both PDF and HTML) across all institutions and individuals. These metrics are regularly updated to reflect usage leading up to the last few days.Citations are the number of other articles citing this article, calculated by Crossref and updated daily. Find more information about Crossref citation counts.The Altmetric Attention Score is a quantitative measure of the attention that a research article has received online. Clicking on the donut icon will load a page at altmetric.com with additional details about the score and the social media presence for the given article. Find more information on the Altmetric Attention Score and how the score is calculated. Share Add toView InAdd Full Text with ReferenceAdd Description ExportRISCitationCitation and abstractCitation and referencesMore Options Share onFacebookTwitterWechatLinked InReddit PDF (688 KB) Get e-Alerts