Concepedia

Deposition and characterization of Ge–Sb–Te layers for applications in optical data storage

Stepan Kyrsta, R. Cremer, D. Neuschütz, Martin Laurenzis, P. Haring Bolívar, H. Kurz

Applied Surface Science · 2001 · 25 citations · 5 references

Concepts

Natural SciencesMaterials EngineeringMaterials ScienceOptical MaterialsSemiconductor MaterialsThin FilmsOptical Thin FilmsSemiconductor NanomaterialsSemiconductor PhysicsSemiconductor SurfacesSemiconductor Thin FilmsThin Film Optical PropertiesDevice FabricationOptical Data StorageSemiconductor Characterization

References

5

Structural transformations of Ge2Sb2Te5 films studied by electrical resistance measurements

I. Friedrich, V. Weidenhof, Walter K. Njoroge et al. · Journal of Applied Physics · 2000 · 660 citations

Natural Sciences, Materials Engineering, Materials Science +15

Crystal structure of GeTe and Ge2Sb2Te5 meta-stable phase

Toshihisa Nonaka, Gentaro Ohbayashi, Yoshiharu Toriumi et al. · Thin Solid Films · 2000 · 305 citations

Natural Sciences, Materials Science, Physics +14

Erasable Phase-Change Optical Materials

Noboru Yamada · MRS Bulletin · 1996 · 176 citations

Natural Sciences, Materials Science, Physics +12

Deposition and Characterization of Metastable Cu 3 N Layers for Applications in Optical Data Storage

R. Cremer, Mirjam Witthaut, Dieter Neusch�tz et al. · Microchimica Acta · 2000 · 73 citations

Natural Sciences, Materials Engineering, Materials Science +14

Free carrier absorption in the Ge:Sb:Te system

J. González‐Hernández, E. López‐Cruz, J. M. Yáñez‐Limón et al. · Solid State Communications · 1995 · 25 citations

Natural Sciences, Electrical Engineering, Materials Science +14