Comparative study of magnetization reversal in isolated and strayfield coupled microcontacts

Abstract

Ferromagnetic microcontacts are key components for future spintronic devices in full metal as well as in hybrid ferromagnet/semiconductor systems. Control of the micromagnetic behavior and especially the reversal process is crucial for the functionality of such devices. We have prepared isolated and strayfield coupled micron sized rectangular Ni∕Fe double layer contacts on silicon nitride membranes. High-resolution magnetic microscopy studies in external fields are performed on identical samples comparing full field magnetic transmission x-ray microscopy and magnetic-force microscopy. The results of both techniques are in good agreement. We find evidence for a strayfield-induced coupling of the domain structure in adjacent contacts in accordance with micromagnetic simulations.