Near edge x-ray absorption fine structure spectroscopy with x-ray free-electron lasers

David P. Bernstein, Yves Acremann, Andreas Scherz, Mark H. Burkhardt, J. Stöhr, Martin Beye, W. F. Schlotter, Torben Beeck, F. Sorgenfrei, Annette Pietzsch,

Applied Physics Letters · 2009 · 27 citations · 12 references

DOIFull text

Open access

Concepts

Abstract

We demonstrate the feasibility of near edge x-ray absorption fine structure spectroscopy on solids by means of femtosecond soft x-ray pulses from a free-electron laser (FEL). Our experiments, carried out at the FEL at Hamburg used a special sample geometry, spectrographic energy dispersion, single shot position-sensitive detection, and a data normalization procedure that eliminates the severe fluctuations of the incident intensity in space and photon energy. As an example, we recorded the D31 N4,5 edge absorption resonance of La3+ ions in LaMnO3. Our study opens the door for x-ray absorption measurements on future x-ray FEL facilities.

References

12