Design for testability strategies for mixed signal & analogue designs-from layout to system

Abstract

The cost and complexity of mixed signal and analogue production test programs is lending to considerable interest in Design for testability (DfT) techniques that have the potential to improve testability by reducing implementation cost and improving outgoing quality. These techniques range from rules and guidelines for schematic and physical design to full built-in-self-test (BIST) solutions. This paper presents a summary of a number of possible DfT approaches that may well help to solve test cost and test quality difficulties for analogue and mixed signal integrated circuits.