International patent analysis as a tool for corporate technology analysis and planning

Abstract

New, techniques of international patent anabsis are illustrated and resultsfrom preliminary validity tests of these techniques are presented. Indicators of technological activity, technological significance and commercial potential are constructed, and used to analyze fiber-based opto-electronic couplers and monoclonal-antibody-based diagnostic kits at the levels o f the technology, nation and firm. The international patent indicators are found to be closely correlated with R&D expenditures, scientific publications and new product introductions. They also relate to these indicators in ways that moke sense as specified in simple regression models of the innovation process. Comparisons of patent analysis results with expert opinion (for two process technologies) reveal that technology–level analyzes conform quite well with expert opinion, but national – and firm–level analyes vary from a low to a modest correlation with expert opinion. The authors conclude that the techniques can provide important information for corporate technology management, but that studies of additional technologies and further validity tests are needed.