On chip crosstalk characterization on deep submicron buses

Abstract

This paper presents the experimental measurement of crosstalk effects in 0.18 /spl mu/m CMOS technology. Based on an on-chip measurement method, we characterize crosstalk on typical interconnect buses for different length of coupled lines, and deduce guidelines concerning critical coupled line length. The effect of the number of aggressors switching simultaneously, on the victim line, is also analyzed.