Publication | Open Access
Fabrication and properties of nano metric tunneling junction
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2006
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Materials ScienceNanoscale SystemEngineeringTunneling MicroscopyMicrofabricationNanotechnologyNanoelectronicsApplied PhysicsTitanium FilmNanometrologyNanofabricationTitanium Oxide LineNanocomputingNanoscale ScienceCoulomb Blockade EffectNanolithography Method
Applicable nano metric titanium-titanium oxide line-titanium tunneling junction was fabricated with dual-facing target sputtering,micro-electronic optical lithography and atomic force microscope anodic oxidation.The thickness of titanium film of the fabricated junction was 3nm and the width of the titanium oxide line was 60.5nm.The I-V curve of the tunneling junction at room temperature clearly indicates the Coulomb blockade effect.