Measurement of small dispersion values in opticalcomponents

Christophe Peucheret, F. Liu, R.J.S. Pedersen

Electronics Letters · 1999 · 19 citations · 4 references

Concepts

Abstract

It is reported that small dispersion values in optical components can be measured using the RF modulation method originally restricted to large dispersions. Using a constant dispersion offset, arbitrarily small dispersion values can be measured with a resolution as good as 1.2 ps/nm.

References

4