Solid-State Electronics · 1997 · 27 citations · 10 references
EngineeringElectrical EngineeringMaterials ScienceElectronic MaterialsSemiconductor DevicesSemiconductor MaterialsMos CapacitorsOxide SemiconductorsSemiconductor InterfacesSemiconductor SurfacesSilicon MaterialsThermal Properties Of SemiconductorsGate Oxide InterfacesOxide Defect StatesRadiometrySilicon Dioxide
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Statistics of the Recombinations of Holes and Electrons
W. Shockley, W. T. Read · Physical Review · 1952 · 6.4K citations
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Ian W. Boyd, T.D. Binnie, J.I.B. Wilson et al. · Journal of Applied Physics · 1984 · 61 citations