2005 · 12 citations · 0 references
EngineeringElectrical EngineeringAnalog ElectronicsInstrumentationTest DevelopmentAnalog InstrumentationAnalog Integrated CircuitsDevice CharacterizationDigital Integrated CircuitsDigital Signal ProcessingSmall-signal AnalysisAnalog Measurement SystemsAnalog TestabilityAnalog-digital ConversionAnalog-to-digital ConversionAnalog-to-digital Converter DesignAnalog-to-digital ConvertersDynamic RangePrecision Measurement
A measurement set-up of for the characterization of analog-to-digital converters (ADCs) is described. The measurement set-up characterizes ADCs up to 16 bits at 350 MHz (option for >500 MHz). Te ...