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In 0.6 Ga 0.4 As/GaAs quantum-dot infrared photodetector with operating temperature up to 260 K
135
Citations
17
References
2003
Year
EngineeringLong Carrier LifetimeOptoelectronic DevicesSemiconductorsElectronic DevicesPhotodetectorsCompound SemiconductorDetection Wave BandPhotonicsElectrical EngineeringPhotoluminescencePhysicsGa 0.4Quantum DeviceOptoelectronic MaterialsAs/gaas Quantum-dotOperating TemperaturePhotoelectric MeasurementInfrared SensorApplied PhysicsQuantum Photonic DeviceHigh TemperatureOptoelectronics
A high-sensitivity In0.6Ga0.4As/GaAs quantum-dot infrared photodetector (QDIP) with detection wave band in 6.7–11.5 μm and operating temperature up to 260 K under normal incident illumination has been demonstrated. The peak detection wavelength shifts from 7.6 to 8.4 μm when the temperature rises from 40 to 260 K. The background limited performance (BLIP) detectivity (DBLIP*) measured at Vb=−2.0 V, T=77 K, and λp=7.6 μm was found to be 1.1×1010 cm Hz1/2/W, with a corresponding responsivity of 0.22 A/W. The high operating temperature is attributed to the very low dark current and long carrier lifetime in the quantum dots of this device. The results show that this QDIP can operate at high temperature without using the large band gap material such as AlGaAs or InGaP as blocking barrier to reduce the device dark current.
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