Redundancy Determination of HVDC MMC Modules

Chan‐Ki Kim, Seong-Doo Lee

Electronics · 2015 · 37 citations · 2 references

DOIFull text

Open access

Concepts

Abstract

An availability and a reliability prediction has been made for a high-voltage direct-current (HVDC) module of VSC (Voltage Source Converter) containing DC/DC converter, gate driver, capacitor and insulated gate bipolar transistors (IGBT). This prediction was made using published failure rates for the electronic equipment. The purpose of this prediction is to determinate the additional module redundancy of VSC and the used method is “binomial failure method”.

References

2