2004 · 13 citations · 8 references
EngineeringElectrical EngineeringAnalog ElectronicsMicroelectronicsSystem-on-chip DesignBuilt-in Self-testCmos Circuit DesignLow-noise Circuit DesignMixed-signal Integrated Circuit DesignNoise TestingRadio-frequency Integrated CircuitsAnalog Built-in Self-testInput ImpedanceLow-cost Built-in Self-testLow-noise AmplifiersNoise FigureReturn LossSelf-testing CircuitsTransceiver Design
This paper presents a new low-cost built-in self-test (BIST) circuit for 5GHz low noise amplifier (LNA). The BIST circuit is designed for system-on-chip (SOC) transceiver environment. The proposed BIST circuit measures the LNA specifications such as input impedance, voltage gain, noise figure, and input return loss all in a single SoC environment.
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