Applied Physics Letters · 2003 · 108 citations · 9 references
Natural SciencesMaterials SciencePhysicsSurface ChemistrySurface ScienceThin FilmsDopingSemiconductor InterfacesSemiconductor SurfacesSemiconductor Thin FilmsSurface PhysicsX-ray Photoelectron SpectroscopyAngle-resolved X-ray Photoelectron SpectroscopyCadmium SulfideDoping In Thin FilmsEpitaxial InterfacesEpitaxial Thin FilmsSurface Defects CharacterizationTransition Metal Dichalcogenides
The chemical composition of the (112)B surface of epitaxial CuInSe2 thin films is investigated by angle resolved x-ray photoelectron spectroscopy. Results show that a severe Cu depletion exists in the top 1–2 atomic layers. No bulk second phase is found at the surface. The source of this depletion and its relation to the Cd doping at the CdS/CuInSe2 interface are discussed.
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Peter J. Cumpson, M. P. Seah · Surface and Interface Analysis · 1997 · 523 citations
Natural Sciences, Materials Engineering, Materials Science +15