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Probabilities associated with a built-in-test system, focus on false alarms

35

Citations

0

References

2004

Year

D. Allen

Unknown Venue

Abstract

This paper shows that some built-in-test (BIT) systems have an intrinsic 50 percent false alarm rate. The paper also shows how Bayes' theorem can be used to analyze how variation of BIT characteristics can increase or decrease the intrinsic false alarm rate.