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High frequency low noise potentialities of down to 65nm technology nodes MOSFETs
25
Citations
8
References
2005
Year
Low-power ElectronicsElectrical EngineeringEngineeringRadio FrequencyRf SemiconductorHigh Frequency PropertiesNanoelectronicsElectronic EngineeringTechnology Nodes MosfetsApplied PhysicsHigh-frequency DeviceBias Temperature InstabilityNoiseLow NoiseMicroelectronicsMicrowave EngineeringHigh Gain Properties
65 nm n-MOSFETs show state-of-the-art cut-off frequency with ft = 210 GHz and microwave low noise and high gain properties (NFmin = 0.8 dB and Gass = 17.3 dB at 12 GHz). As compared with the previous nodes, the high frequency properties of these MOSFETs continue to be in agreement with the downscaling trends.
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