Concepedia

Nion (United States)

N(

Statistics

Publications

188

Citations

41.4K

Authors

25

Location

Kirkland, United States

Nion (United States) is a company institution in Kirkland, United States known for natural sciences, physics, and electron microscopy.

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Publications

188

Atom-by-atom structural and chemical analysis by annular dark-field electron microscopy

Ondrej L. Krivanek, Matthew F. Chisholm, Valeria Nicolosi et al. · Nature · 2010 · 1.3K citations

, , +13

Sub-ångstrom resolution using aberration corrected electron optics

Philip E. Batson, Niklas Dellby, Ondrej L. Krivanek · Nature · 2002 · 899 citations

, , +11

Vibrational spectroscopy in the electron microscope

Ondrej L. Krivanek, Tracy C. Lovejoy, Niklas Dellby et al. · Nature · 2014 · 725 citations

, , +7

Atomic-Scale Chemical Imaging of Composition and Bonding by Aberration-Corrected Microscopy

David A. Muller, Lena F. Kourkoutis, J. H. Song et al. · Science · 2008 · 610 citations

, , +17

Towards sub-Å electron beams

Ondrej L. Krivanek, Niklas Dellby, Andrew R. Lupini · Ultramicroscopy · 1999 · 604 citations

, , +7

1–5 of 188

Authors

25

  1. OL
    Ondrej L. Krivanek

    Nion (United States), United States

    223 publications · 11.9K citations

    46

    h-index

  2. ND
    Niklas Dellby

    Nion (United States), United States

    149 publications · 9.1K citations

    31

    h-index

  3. ZS
    Zoltán Szilágyi

    Nion (United States), United States

    56 publications · 3.3K citations

    19

    h-index

  4. MF
    Matthew F. Murfitt

    Nion (United States), United States

    42 publications · 3.9K citations

    16

    h-index

  5. TC
    Tracy C. Lovejoy

    Nion (United States), United States

    58 publications · 2.3K citations

    15

    h-index

1–5 of 25