Memtronics (United States)

Modeling and characterization of dielectric-charging effects in RF MEMS capacitive switches

Xiaobin Yuan, James C. M. Hwang, David Forehand et al. · IEEE MTT-S International Microwave Symposium Digest, 2005. · 2005 · 113 citations

Electrical Engineering, Dielectrics, Engineering +10

Initial observation and analysis of dielectric-charging effects on RF MEMS capacitive switches

Xiaobin Yuan, S.V. Cherepko, James C. M. Hwang et al. · 2004 · 89 citations

Capacitance Voltage, Electrical Engineering, Dielectrics +15

Acceleration of Dielectric Charging in RF MEMS Capacitive Switches

Xiaobin Yuan, Zhen Peng, James C. M. Hwang et al. · IEEE Transactions on Device and Materials Reliability · 2006 · 82 citations

Electrical Engineering, Dielectrics, Engineering +10

High-Cycle Life Testing of RF MEMS Switches

Charles L. Goldsmith, David Forehand, James C. M. Hwang et al. · IEEE MTT-S International Microwave Symposium digest · 2007 · 67 citations

Electrical Engineering, Engineering, Microfabrication +13

Temperature variation of actuation voltage in capacitive MEMS switches

Charles L. Goldsmith, David Forehand · IEEE Microwave and Wireless Components Letters · 2005 · 64 citations

Electrical Engineering, Engineering, Microfabrication +8