k-Space Associates (United States)

Substrate temperature measurement using a commercial band-edge detection system

I. Farrer, J. J. Harris, Robert R. Thomson et al. · Journal of Crystal Growth · 2006 · 21 citations

Electrical Engineering, Engineering, Thermography +10

Growth related interference effects in band edge thermometry of semiconductors

R. N. Sacks, D. Barlett, C. A. Taylor et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 2005 · 20 citations

Wide-bandgap Semiconductor, Optical Materials, Engineering +18

Real-time strain monitoring in thin film growth: cubic boron nitride on Si (100)

Dmitri Litvinov, Roy Clarke, Charles A. Taylor et al. · Materials Science and Engineering B · 1999 · 19 citations

Materials Science, Boron Nitride, Engineering +7

Use of band-gap thermometry to investigate the growth of GaN on sapphire and GaAs

C. T. Foxon, R. P. Campion, V. A. Grant et al. · Journal of Crystal Growth · 2006 · 15 citations

Semiconductors, Wide-bandgap Semiconductor, Electrical Engineering +9

The ECSS Packet Utilization Standard and Its Support Tool

Mario Merri, Bryan Melton, Serge Valera et al. · SpaceOps 2002 Conference · 2002 · 15 citations · Full text