X-ray Source Characterization

X-Ray Source Characterization is a systematic methodology used in x-ray detection research to identify and quantify the physical properties, spatial distribution, intensity, and energy spectrum of an x-ray source, thereby distinguishing it from other detection or imaging processes by focusing specifically on the intrinsic attributes and operational parameters of the source itself.

678

Publications

29K

Citations

2.6K

Authors

680

Institutions

Publications per year

2017–2026

58

Authors

2.6K

  1. AC
    A. C. Fabian

    University of Cambridge, United Kingdom

    12 publications · 863 citations

    12

    h-index

  2. GP
    G. P. Garmire

    Pennsylvania State University, United States

    12 publications · 738 citations

    11

    h-index

  3. AZ
    A. Zezas

    Center for Astrophysics Harvard & Smithsonian, United States

    11 publications · 924 citations

    11

    h-index

  4. HG
    H. Gursky

    Massachusetts Institute of Technology, United States

    11 publications · 525 citations

    11

    h-index

  5. RG
    R. Giacconi

    Johns Hopkins University, United States

    10 publications · 626 citations

    10

    h-index

1–5 of 2.6K

Venues

  1. The Astrophysical Journal

    ApJ · 245 publications · 11.4K citations

    54

    h-index

  2. Monthly Notices of the Royal Astronomical Society

    86 publications · 3.6K citations

    33

    h-index

  3. Astronomy and Astrophysics

    47 publications · 1.7K citations

    25

    h-index

  4. The Astronomical Journal

    AJ · 24 publications · 925 citations

    18

    h-index

  5. Review of Scientific Instruments

    21 publications · 540 citations

    15

    h-index

1–5