Topography Control

Topography Control is a methodological framework within sheet lamination processes that enables the precise regulation of surface morphology and layer alignment through controlled deposition and bonding of material layers to achieve desired three-dimensional structural characteristics.

29

Publications

1K

Citations

150

Authors

76

Institutions

Publications per year

2017–2026

8

Authors

150

  1. FS
    F. Salmassi

    Lawrence Berkeley National Laboratory, United States

    2 publications · 43 citations

    2

    h-index

  2. PN
    Patrick Naulleau

    Lawrence Berkeley National Laboratory, United States

    2 publications · 43 citations

    2

    h-index

  3. JA
    J. Alexander Liddle

    Lawrence Berkeley National Laboratory, United States

    2 publications · 43 citations

    2

    h-index

  4. EM
    Eric M. Gullikson

    Lawrence Berkeley National Laboratory, United States

    2 publications · 43 citations

    2

    h-index

  5. TJ
    Tommaso Jacopo Giammaria

    Università degli Studi del Piemonte Orientale “Amedeo Avogadro”, Italy

    1 publications · 20 citations

    1

    h-index

1–5 of 150

Venues

  1. IEEE Transactions on Magnetics

    2 publications · 33 citations

    2

    h-index

  2. Nanotechnology

    1 publications · 23 citations

    1

    h-index

  3. Procedia CIRP

    1 publications · 43 citations

    1

    h-index

  4. 1

    h-index

  5. Solid-State Electronics

    1 publications · 15 citations

    1

    h-index

1–5