Terminal Characterization

Terminal Characterization is a modeling method that distinguishes itself by determining the equivalent voltage and impedance of a linear network as observed from a pair of terminals, enabling the reduction of complex circuits to a simplified Thevenin equivalent model.

22

Publications

749

Citations

55

Authors

23

Institutions

Publications per year

2017–2026

2

Authors

55

  1. FW
    Fred Wang

    University of Tennessee at Knoxville, United States

    4 publications · 158 citations

    4

    h-index

  2. RB
    Rolando Burgos

    Virginia Tech, United States

    4 publications · 158 citations

    4

    h-index

  3. DB
    Dushan Boroyevich

    Virginia Tech, United States

    4 publications · 158 citations

    4

    h-index

  4. LA
    Luis Arnedo

    Virginia Tech, United States

    3 publications · 108 citations

    3

    h-index

  5. JA
    Jeffery A. Winer

    University of California, Berkeley, United States

    1 publications · 36 citations

    1

    h-index

1–5 of 55

Venues

  1. American Journal of Medical Genetics

    1 publications · 38 citations

    1

    h-index

  2. 1

    h-index

  3. PLoS ONE

    1 publications · 17 citations

    1

    h-index

  4. Analytical Chemistry

    1 publications · 62 citations

    1

    h-index

  5. Canadian Journal of Mathematics

    1 publications · 12 citations

    1

    h-index

1–5