Scan-based Self-checking

Scan-Based Self-Checking is a self-checking circuit technique that belongs to the class of concurrent error-detection methods and is distinguished by its incorporation of scan-chain architectures to enable both normal operational mode and testable, real-time fault detection through structured periodic validation of circuit behavior.

Publications

150

Citations

Authors

Institutions

Publications per year

2017–2026

Parents

Self-checking Circuits

Publications

On-line fault detection for bus-based field programmable gate arrays

Nathan Shnidman, William H. Mangione-Smith, Miodrag Potkonjak · IEEE Transactions on Very Large Scale Integration (VLSI) Systems · 1998 · 64 citations

Engineering, Computer Engineering, Computer Science +15

CryptoScan: A Secured Scan Chain Architecture

Debdeep Mukhopadhyay, Somnath Banerjee, Dipanwita RoyChowdhury et al. · 2005 · 49 citations

Computing, Computer Engineering, Computer Science +16

Low-Cost Online Testing of Asynchronous Handshakes

Delong Shang, Alex Yakovlev, Frank Burns et al. · 2006 · 21 citations

Engineering, Computer Engineering, Computer Science +12

A resource approach to on-line testing of computing circuits

Julia Drozd, Mohammed M. Al-Dhabi · 2015 · 16 citations

Engineering, Computer Engineering, Computer Science +16

1–4 of 4

Authors

DS
Delong Shang
Newcastle University, United Kingdom
1 publications · 21 citations
1
h-index
DR
Dipanwita RoyChowdhury
Indian Institute of Technology Kharagpur, India
1 publications · 49 citations
1
h-index
AB
A. Bystrov
Newcastle University, United Kingdom
1 publications · 21 citations
1
h-index
MP
Miodrag Potkonjak
University of California, Los Angeles, United States
1 publications · 64 citations
1
h-index
JD
Julia Drozd
Odesа Polytechnic National University, Ukraine
1 publications · 16 citations
1
h-index

1–5 of 14

Institutions

1–5 of 5

Venues

IEEE Transactions on Very Large Scale Integration (VLSI) Systems
1 publications · 64 citations
1
h-index

1–1