Scan Chain Attacks

Scan Chain Attack is a type of side-channel attack in hardware security that exploits the test infrastructure of integrated circuits, particularly the scan chains used for manufacturing testing, to extract secret keys or sensitive information by observing or manipulating the internal states during test mode operation.

69

Publications

3.4K

Citations

120

Authors

59

Institutions

Publications per year

2017–2026

29

Authors

120

  1. MF
    Marie-Lise Flottes

    Laboratoire d'Informatique, de Robotique et de Microélectronique de Montpellier, France

    14 publications · 615 citations

    14

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  2. BR
    Bruno Rouzeyre

    Laboratoire d'Informatique, de Robotique et de Microélectronique de Montpellier, France

    14 publications · 615 citations

    14

    h-index

  3. GD
    Giorgio Di Natale

    Laboratoire d'Informatique, de Robotique et de Microélectronique de Montpellier, France

    12 publications · 553 citations

    12

    h-index

  4. RK
    Ramesh Karri

    New York University, United States

    9 publications · 596 citations

    10

    h-index

  5. MY
    Masao Yanagisawa

    Waseda University, Japan

    9 publications · 367 citations

    9

    h-index

1–5 of 120

Venues

  1. 7

    h-index

  2. 5

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  3. IEEE Transactions on Emerging Topics in Computing

    ITETBT · 4 publications · 200 citations

    4

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  4. ACM Transactions on Design Automation of Electronic Systems

    TODAES · 3 publications · 149 citations

    3

    h-index

  5. IEEE Access

    3 publications · 88 citations

    3

    h-index

1–5