Scan Chain Attacks
Scan Chain Attack is a type of side-channel attack in hardware security that exploits the test infrastructure of integrated circuits, particularly the scan chains used for manufacturing testing, to extract secret keys or sensitive information by observing or manipulating the internal states during test mode operation.
69
Publications
3.4K
Citations
120
Authors
59
Institutions
Publications per year
2017–2026
29
Parents
69
1–5 of 69
120
Laboratoire d'Informatique, de Robotique et de Microélectronique de Montpellier, France
14 publications · 615 citations
14
h-index
Laboratoire d'Informatique, de Robotique et de Microélectronique de Montpellier, France
14 publications · 615 citations
14
h-index
Laboratoire d'Informatique, de Robotique et de Microélectronique de Montpellier, France
12 publications · 553 citations
12
h-index
10
h-index
9
h-index
1–5 of 120
59
Laboratoire d'Informatique, de Robotique et de Microélectronique de Montpellier
Montpellier, France
13 h-index
54 publications
2.1K citations
New York University
New York, United States
12 h-index
27 publications
986 citations

Université de Montpellier
Montpellier, France
11 h-index
44 publications
1.8K citations

Centre National de la Recherche Scientifique
Paris, France
11 h-index
46 publications
1.8K citations
Waseda University
Tokyo, Japan
9 h-index
36 publications
1.5K citations

SUNY Polytechnic Institute
Utica, United States
9 h-index
16 publications
1.4K citations
New York University Abu Dhabi
Abu Dhabi, United Arab Emirates
6 h-index
11 publications
344 citations
University of Florida
Gainesville, United States
4 h-index
13 publications
794 citations
1–8 of 59
7 publications · 514 citations
7
h-index
5 publications · 184 citations
5
h-index
ITETBT · 4 publications · 200 citations
4
h-index
TODAES · 3 publications · 149 citations
3
h-index
3 publications · 88 citations
3
h-index
1–5