Representative Artifact Sampling
Representative Artifact Sampling is a systematic method within the broader category of artifact selection techniques that identifies and selects artifacts—such as models, datasets, or metrics—based on their ability to reflect the central characteristics, distribution, or diversity of a larger artifact population, thereby ensuring validity and generalizability in empirical analysis.
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Publications
43
Citations
8
Authors
4
Institutions
Publications per year
2017–2026
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Parents
2
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University of Exeter
Exeter, United Kingdom
1 h-index
2 publications
56 citations
Virginia Tech
Blacksburg, United States
1 h-index
1 publications
15 citations

University of Science and Technology Beijing
Beijing, China
1 h-index
1 publications
28 citations
Curtin University
Perth, Australia
1 h-index
3 publications
84 citations
1–4 of 4
1 publications · 28 citations
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1 publications · 15 citations
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