Reflectance Invariance

Reflectance Invariance is a property in reflectance modeling that characterizes the stability of surface reflectance estimates under varying illumination conditions, distinguishing it from appearance-based models by focusing on the intrinsic photometric consistency of materials independent of lighting geometry.

18

Publications

1.3K

Citations

41

Authors

31

Institutions

Publications per year

2017–2026

2

Authors

41

  1. RR
    Ravi Ramamoorthi

    University of California, Berkeley, United States

    3 publications · 101 citations

    3

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  2. TW
    Ting-Chun Wang

    Nanjing University of Information Science and Technology, China

    2 publications · 67 citations

    2

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  3. AS
    A.W.M. Smeulders

    University of Amsterdam, Netherlands

    2 publications · 562 citations

    2

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  4. MC
    Manmohan Chandraker

    University of California San Diego, United States

    2 publications · 67 citations

    2

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  5. JG
    Jan‐Mark Geusebroek

    University of Amsterdam, Netherlands

    2 publications · 562 citations

    2

    h-index

1–5 of 41

Venues

  1. 4

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  2. CERN Document Server (European Organization for Nuclear Research)

    Repository · 1 publications · 53 citations

    1

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  3. International Journal of Computer Vision

    1 publications · 54 citations

    1

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  4. 1

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  5. 1

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1–5