Pull-in Characterization
Pull-In Characterization is a MEMS characterization method that identifies the critical voltage and displacement at which electrostatic actuation induces structural instability in micro-scale mechanical systems, distinguishing it from other electromechanical analyses by focusing on the onset of nonlinear collapse in capacitive transducers.
77
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2.5K
Citations
235
Authors
92
Institutions
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2017–2026
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Sharif University of Technology
Tehran, Iran
6 h-index
18 publications
621 citations

Delft University of Technology
Delft, The Netherlands
5 h-index
16 publications
1.3K citations
Henan Polytechnic University
Jiaozuo, China
3 h-index
3 publications
100 citations
Xi'an University of Architecture and Technology
Xi'an, China
3 h-index
7 publications
239 citations

McGill University
Montreal, Canada
3 h-index
5 publications
110 citations

Indian Institute of Technology Madras
Chennai, India
3 h-index
6 publications
135 citations
Stanford University
Stanford, United States
3 h-index
14 publications
525 citations

Centre National de la Recherche Scientifique
Paris, France
3 h-index
9 publications
242 citations
1–8 of 92
JMM · 9 publications · 168 citations
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6 publications · 455 citations
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5 publications · 169 citations
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4 publications · 169 citations
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3 publications · 80 citations
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