Probe Error Compensation
Probe Error Compensation is a metrological methodology that corrects systematic deviations in coordinate measurements by accounting for the physical and dynamic characteristics of the probing system, thereby isolating the true geometry of the measured object from artifacts introduced by the probe.
42
Publications
1.1K
Citations
117
Authors
56
Institutions
Publications per year
2017–2026
9
Parents
42
Error compensation for CMM touch trigger probes
William T. Estler, Steven Phillips, Bruce R. Borchardt et al. · Precision Engineering · 1996 · 85 citations
Engineering, Electrical Engineering, Mechatronics Engineering +14
On the probe compensation for near-field measurements on a sphere
Frank B. Jensen · ArElU · 1975 · 68 citations
1–5 of 42
117
3
h-index
2
h-index
2
h-index
2
h-index
2
h-index
1–5 of 117
56
George Washington University
Washington, United States
4 h-index
8 publications
334 citations
National Institute of Standards and Technology
Gaithersburg, United States
3 h-index
17 publications
1.1K citations
Warsaw University of Technology
Warsaw, Poland
3 h-index
5 publications
113 citations

Hong Kong University of Science and Technology
Hong Kong, Hong Kong
2 h-index
2 publications
66 citations
Tianjin University
Tianjin, China
2 h-index
3 publications
45 citations
Seoul National University
Seoul, South Korea
2 h-index
4 publications
65 citations

University Town of Shenzhen
Shenzhen, China
2 h-index
6 publications
208 citations

Polytechnique Montréal
Montreal, Canada
2 h-index
7 publications
246 citations
1–8 of 56
5 publications · 138 citations
5
h-index
5 publications · 196 citations
5
h-index
4 publications · 93 citations
4
h-index
2 publications · 33 citations
2
h-index
2 publications · 33 citations
2
h-index
1–5