Planar Interface Stability

Planar Interface Stability is a theoretical construct in materials science that characterizes the capacity of a solid-liquid interface to maintain a flat, non-perturbed morphology during directional solidification, distinguishing it from morphologically unstable interfaces that evolve into cellular or dendritic structures under constitutional supercooling conditions.

69

Publications

6.2K

Citations

164

Authors

76

Institutions

Publications per year

2017–2026

4

Authors

164

  1. GY
    Gencang Yang

    Northwestern Polytechnical University, China

    3 publications · 51 citations

    3

    h-index

  2. SC
    S.R. Coriell

    National Institute of Standards and Technology, United States

    3 publications · 186 citations

    3

    h-index

  3. RT
    R. Trivedi

    Iowa State University, United States

    3 publications · 310 citations

    3

    h-index

  4. RF
    Robert F. Sekerka

    Carnegie Mellon University, United States

    3 publications · 3.3K citations

    3

    h-index

  5. SS
    Sanjay Sampath

    Stony Brook University, United States

    2 publications · 48 citations

    2

    h-index

1–5 of 164

Venues

  1. Journal of Crystal Growth

    7 publications · 239 citations

    7

    h-index

  2. Physical Review Letters

    PRL · 4 publications · 355 citations

    4

    h-index

  3. Langmuir

    3 publications · 80 citations

    3

    h-index

  4. 3

    h-index

  5. Annual Review of Materials Science

    2 publications · 136 citations

    2

    h-index

1–5