Patch Roundness

Patch Roundness is a morphometric metric that quantifies the degree to which a two-dimensional spatial patch approximates the geometric compactness of a perfect circle, distinguished by its reliance on the ratio of the patch's area to the area of a circle with the same perimeter.

9

Publications

422

Citations

19

Authors

11

Institutions

Publications per year

2017–2026

1

Authors

19

  1. MC
    Mu‐Chen Chen

    National Yang Ming Chiao Tung University, Taiwan

    2 publications · 80 citations

    2

    h-index

  2. WL
    Ward Lopes

    University of Chicago, United States

    1 publications · 42 citations

    1

    h-index

  3. DT
    Du‐Ming Tsai

    Yuan Ze University, Taiwan

    1 publications · 39 citations

    1

    h-index

  4. TN
    Tadatoshi Nomura

    Tohoku University, Japan

    1 publications · 95 citations

    1

    h-index

  5. ML
    Michele Lanzetta

    University of Pisa, Italy

    1 publications · 67 citations

    1

    h-index

1–5 of 19

Venues

  1. Precision Engineering

    2 publications · 148 citations

    2

    h-index

  2. Measurement

    2 publications · 91 citations

    2

    h-index

  3. Pattern Recognition Letters

    1 publications · 39 citations

    1

    h-index

  4. Computers & Industrial Engineering

    1 publications · 32 citations

    1

    h-index

  5. Marine Geology

    1 publications · 42 citations

    1

    h-index

1–5