Concepedia

Or Gate

An Or Gate is a logical operator in fault tree analysis that belongs to the class of Boolean gates, distinguished by its function of producing a true output when at least one of its input events is true, thereby representing the union of failure paths in a system’s reliability model.

134

Publications

5.1K

Citations

438

Authors

195

Institutions

Publications per year

2017–2026

44

Parents

Publications

134

Easily Testable Realizations ror Logic Functions

S.M. Reddy · IEEE Transactions on Computers · 1972 · 278 citations

, , +13

On Finding a Nearly Minimal Set of Fault Detection Tests for Combinational Logic Nets

D. B. Armstrong · IEEE Transactions on Electronic Computers · 1966 · 227 citations

, , +13

Proposal for 4‐to‐2 optical encoder based on photonic crystals

Farhad Mehdizadeh, Mohammad Soroosh, Hamed Alipour‐Banaei · IET Optoelectronics · 2016 · 161 citations

, , +17

Fully Integrated AND and OR Optical Logic Gates

Raghda M. Younis, Nihal F. F. Areed, S. S. A. Obayya · IEEE Photonics Technology Letters · 2014 · 143 citations

, , +17

Threshold logic

D. Hampel, R. O. Winder · IEEE Spectrum · 1971 · 127 citations

, , +13

1–5 of 134

Authors

438

  1. SK
    S. Kotani

    Fujitsu (Japan), Japan

    3 publications · 98 citations

    3

    h-index

  2. SH
    S. Hasuo

    Fujitsu (Japan), Japan

    3 publications · 98 citations

    3

    h-index

  3. JH
    Jie Han

    University of Alberta, Canada

    3 publications · 91 citations

    3

    h-index

  4. JX
    Jianwen Xiang

    Wuhan University of Technology, China

    3 publications · 61 citations

    3

    h-index

  5. EJ
    Ernest J. Henley

    University of Houston, United States

    3 publications · 95 citations

    3

    h-index

1–5 of 438

Institutions

195

  1. University of Science and Technology of China

    Hefei, China

    4 h-index

    12 publications

    290 citations

  2. Loughborough University

    Loughborough, United Kingdom

    3 h-index

    5 publications

    106 citations

  3. University of Houston

    Houston, United States

    3 h-index

    4 publications

    105 citations

  4. Chinese Academy of Sciences

    Beijing, China

    3 h-index

    8 publications

    556 citations

  5. Fujitsu (Japan)

    Kawasaki, Japan

    3 h-index

    11 publications

    365 citations

  6. University of Alberta

    Edmonton, Canada

    3 h-index

    7 publications

    251 citations

  7. Kyoto University

    Kyoto, Japan

    3 h-index

    5 publications

    253 citations

  8. University of Florida

    Gainesville, United States

    3 h-index

    16 publications

    690 citations

1–8 of 195

Venues

  1. IEEE Transactions on Reliability

    8 publications · 228 citations

    9

    h-index

  2. IEEE Transactions on Computers

    3 publications · 306 citations

    3

    h-index

  3. Applied Physics Letters

    3 publications · 115 citations

    3

    h-index

  4. ACS Applied Materials & Interfaces

    2 publications · 98 citations

    2

    h-index

  5. Physical review. E

    PRE · 2 publications · 35 citations

    2

    h-index

1–5