Noise Immunity

Noise Immunity is the inherent capability of a standard cell to maintain correct logical operation despite disturbances caused by voltage fluctuations or electrical noise, distinguishing it from related performance metrics by focusing specifically on functional resilience under non-ideal signal conditions.

708

Publications

28.3K

Citations

2.2K

Authors

667

Institutions

Publications per year

2017–2026

209

Authors

2.2K

  1. VK
    Volkan Kursun

    University of Wisconsin–Madison, United States

    10 publications · 349 citations

    10

    h-index

  2. KR
    Kaushik Roy

    Purdue University West Lafayette, United States

    7 publications · 299 citations

    7

    h-index

  3. EG
    Eby G. Friedman

    University of Rochester, United States

    7 publications · 240 citations

    7

    h-index

  4. KL
    Kenneth L. Shepard

    Columbia University, United States

    6 publications · 783 citations

    6

    h-index

  5. SM
    Santanu Mishra

    Indian Institute of Technology Kanpur, India

    6 publications · 647 citations

    6

    h-index

1–5 of 2.2K

Venues

  1. IEEE Journal of Solid-State Circuits

    36 publications · 1.8K citations

    21

    h-index

  2. IEEE Transactions on Power Electronics

    20 publications · 1.5K citations

    18

    h-index

  3. 12

    h-index

  4. Sensors

    11 publications · 376 citations

    11

    h-index

  5. IEEE Transactions on Industrial Electronics

    11 publications · 1.1K citations

    11

    h-index

1–5