Noise Compensation

Noise Compensation is a methodological framework in atomic force microscopy that systematically identifies, characterizes, and mitigates sensor noise through adaptive signal processing techniques to enhance measurement accuracy and imaging resolution.

440

Publications

19.1K

Citations

1.5K

Authors

528

Institutions

Publications per year

2017–2026

100

Authors

1.5K

  1. SO
    S. O. Reza Moheimani

    University of Newcastle Australia, Australia

    6 publications · 330 citations

    6

    h-index

  2. KK
    Kei Kobayashi

    Kyoto University, Japan

    5 publications · 256 citations

    5

    h-index

  3. HY
    Hirofumi Yamada

    Kyoto University, Japan

    5 publications · 256 citations

    5

    h-index

  4. TF
    Takeshi Fukuma

    Kanazawa University, Japan

    5 publications · 185 citations

    5

    h-index

  5. MG
    Mark Gales

    University of Cambridge, United Kingdom

    4 publications · 232 citations

    4

    h-index

1–5 of 1.5K

Venues

  1. Review of Scientific Instruments

    46 publications · 1.7K citations

    22

    h-index

  2. Optics Express

    21 publications · 938 citations

    17

    h-index

  3. Applied Physics Letters

    11 publications · 1K citations

    11

    h-index

  4. Nanotechnology

    11 publications · 538 citations

    11

    h-index

  5. Ultramicroscopy

    10 publications · 507 citations

    10

    h-index

1–5