Multiprobe Scanning Probe Microscopy

Multiprobe Scanning Probe Microscopy is a scanning probe microscopy technique that employs multiple spatially separated probes simultaneously to enable correlated nanoscale imaging, manipulation, and measurement across extended sample areas or with multifunctional capabilities beyond the scope of single-probe methods.

20

Publications

716

Citations

88

Authors

41

Institutions

Publications per year

2017–2026

2

Authors

88

  1. AS
    Alex S. Walton

    University of Manchester, United Kingdom

    1 publications · 11 citations

    1

    h-index

  2. MA
    Masakazu Aono

    National Institute for Materials Science, Japan

    1 publications · 13 citations

    1

    h-index

  3. PM
    Paul McClure

    Xidex (United States), United States

    1 publications · 23 citations

    1

    h-index

  4. SK
    Stefan Korte

    Forschungszentrum Jülich, Germany

    1 publications · 13 citations

    1

    h-index

  5. AM
    André Meister

    Swiss Center for Electronics and Microtechnology (Switzerland), Switzerland

    1 publications · 35 citations

    1

    h-index

1–5 of 88

Venues

  1. Review of Scientific Instruments

    3 publications · 45 citations

    3

    h-index

  2. Nanotechnology

    2 publications · 23 citations

    2

    h-index

  3. Journal of Physics Condensed Matter

    2 publications · 50 citations

    2

    h-index

  4. Nano Research

    1 publications · 13 citations

    1

    h-index

  5. Chinese Physics

    1 publications · 27 citations

    1

    h-index

1–5