Multiprobe Scanning Probe Microscopy
Multiprobe Scanning Probe Microscopy is a scanning probe microscopy technique that employs multiple spatially separated probes simultaneously to enable correlated nanoscale imaging, manipulation, and measurement across extended sample areas or with multifunctional capabilities beyond the scope of single-probe methods.
20
Publications
716
Citations
88
Authors
41
Institutions
Publications per year
2017–2026
2
Parents
20
1–5 of 20
88
1
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Swiss Center for Electronics and Microtechnology (Switzerland), Switzerland
1 publications · 35 citations
1
h-index
1–5 of 88
41

University of Duisburg-Essen
Essen, Germany
2 h-index
6 publications
108 citations

Oak Ridge National Laboratory
Oak Ridge, United States
2 h-index
8 publications
104 citations
National Institute for Materials Science
Tsukuba, Japan
2 h-index
6 publications
96 citations
Unilever (United Kingdom)
London, United Kingdom
1 h-index
1 publications
48 citations

Chinese Academy of Sciences
Beijing, China
1 h-index
7 publications
189 citations

Swiss Center for Electronics and Microtechnology (Switzerland)
Neuchâtel, Switzerland
1 h-index
4 publications
140 citations
Jülich Aachen Research Alliance
Jülich, Germany
1 h-index
2 publications
26 citations

Centre National de la Recherche Scientifique
Paris, France
1 h-index
1 publications
31 citations
1–8 of 41
3 publications · 45 citations
3
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2 publications · 23 citations
2
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2 publications · 50 citations
2
h-index
1 publications · 13 citations
1
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1 publications · 27 citations
1
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