Migration Reliability

Migration Reliability is a metric that quantifies the consistency and dependability of virtual machine migration processes in preserving service availability and data integrity under varying storage and network conditions during live migration.

26

Publications

751

Citations

93

Authors

48

Institutions

Publications per year

2017–2026

9

Authors

93

  1. GH
    Gábor Harsányi

    Budapest University of Technology and Economics, Hungary

    2 publications · 81 citations

    2

    h-index

  2. PA
    P. Aruna

    Orthopaedic Research Group, India

    1 publications · 24 citations

    1

    h-index

  3. LS
    Larisa Shwartz

    IBM Research - Thomas J. Watson Research Center, United States

    1 publications · 12 citations

    1

    h-index

  4. AL
    Alexander L. Wijesinha

    Towson University, United States

    1 publications · 15 citations

    1

    h-index

  5. PT
    Peter Tröger

    Hasso Plattner Institute, Germany

    1 publications · 12 citations

    1

    h-index

1–5 of 93

Venues

  1. Microelectronics Reliability

    2 publications · 81 citations

    2

    h-index

  2. ACM SIGOPS Operating Systems Review

    1 publications · 36 citations

    1

    h-index

  3. Computer Systems Science and Engineering

    1 publications · 16 citations

    1

    h-index

  4. Computers & Electrical Engineering

    1 publications · 39 citations

    1

    h-index

  5. Computers

    1 publications · 25 citations

    1

    h-index

1–5