Mass Sensing Characterization
Mass Sensing Characterization is a methodological framework within MEMS characterization that uniquely enables the quantification and analysis of mass-induced shifts in resonant frequency to determine minute mass changes at the micro- or nanoscale.
122
Publications
5.3K
Citations
435
Authors
188
Institutions
Publications per year
2017–2026
36
Parents
122
Very High Frequency Silicon Nanowire Electromechanical Resonators
Philip X.‐L. Feng, Rongrui He, Peidong Yang et al. · Nano Letters · 2007 · 396 citations
Ultrahigh Frequency Nanotube Resonators
Haibing Peng, Chih-Wei Chang, Shaul Aloni et al. · Physical Review Letters · 2006 · 340 citations
1–5 of 122
435
5
h-index
University of Electronic Science and Technology of China, China
4 publications · 85 citations
4
h-index
4
h-index
4
h-index
4
h-index
1–5 of 435
188

Centre National de la Recherche Scientifique
Paris, France
7 h-index
18 publications
1.3K citations

University of Electronic Science and Technology of China
Chengdu, China
5 h-index
17 publications
368 citations
Dalian University of Technology
Dalian, China
5 h-index
18 publications
647 citations
Technical University of Denmark
Kongens Lyngby, Denmark
5 h-index
16 publications
1.1K citations

Universitat Autònoma de Barcelona
Cerdanyola del Vallès, Spain
5 h-index
21 publications
947 citations
Franche-Comté Électronique Mécanique Thermique et Optique - Sciences et Technologies
Besançon, France
4 h-index
9 publications
594 citations

École Nationale Supérieure de Mécanique et des Microtechniques
Besançon, France
4 h-index
9 publications
594 citations
Nanyang Technological University
Singapore, Singapore
4 h-index
7 publications
232 citations
1–8 of 188
16 publications · 953 citations
14
h-index
8 publications · 189 citations
8
h-index
5 publications · 137 citations
5
h-index
5 publications · 151 citations
5
h-index
JMM · 4 publications · 212 citations
4
h-index
1–5