Lateral Force Microscopy
Lateral Force Microscopy is a scanning probe microscopy technique that distinguishes itself by measuring variations in lateral deflection of the cantilever to characterize surface frictional properties at the nanoscale.
359
Publications
19.4K
Citations
1.2K
Authors
364
Institutions
Publications per year
2017–2026
39
Variants
FfmLfm
Parents
359
Martin Dienwiebel, Gertjan S. Verhoeven, Namboodiri Pradeep et al. · Physical Review Letters · 2004 · 1.4K citations
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Kyushu University
Fukuoka, Japan
10 h-index
49 publications
1.7K citations

University of Basel
Basel, Switzerland
9 h-index
50 publications
3.8K citations
ETH Zurich
Zurich, Switzerland
9 h-index
34 publications
1.8K citations
Northwestern University
Evanston, United States
9 h-index
27 publications
1.9K citations
University of Illinois Urbana-Champaign
Urbana, United States
8 h-index
21 publications
995 citations

Cornell University
Ithaca, United States
8 h-index
20 publications
1K citations

Chinese Academy of Sciences
Beijing, China
8 h-index
30 publications
1.2K citations

Hanyang University
Seoul, South Korea
7 h-index
27 publications
834 citations
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62 publications · 3.1K citations
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32 publications · 2.1K citations
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15 publications · 636 citations
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13 publications · 551 citations
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