Lateral Force Microscopy

Lateral Force Microscopy is a scanning probe microscopy technique that distinguishes itself by measuring variations in lateral deflection of the cantilever to characterize surface frictional properties at the nanoscale.

359

Publications

19.4K

Citations

1.2K

Authors

364

Institutions

Publications per year

2017–2026

39

Variants

FfmLfm

Authors

1.2K

  1. ND
    Nicholas D. Spencer

    ETH Zurich, Switzerland

    10 publications · 760 citations

    10

    h-index

  2. EM
    Ernst Meyer

    University of Basel, Switzerland

    9 publications · 664 citations

    9

    h-index

  3. AT
    Atsushi Takahara

    Kyushu University, Japan

    8 publications · 303 citations

    8

    h-index

  4. KT
    Keiji Tanaka

    Kyushu University, Japan

    7 publications · 238 citations

    7

    h-index

  5. HS
    Hiroyuki Sugimura

    Nagoya University, Japan

    7 publications · 143 citations

    7

    h-index

1–5 of 1.2K

Venues

  1. Langmuir

    62 publications · 3.1K citations

    32

    h-index

  2. Review of Scientific Instruments

    32 publications · 2.1K citations

    21

    h-index

  3. Applied Physics Letters

    21 publications · 3K citations

    19

    h-index

  4. Nanotechnology

    15 publications · 636 citations

    13

    h-index

  5. 13

    h-index

1–5