Interface Abruptness

Interface Abruptness is a metric in epitaxial growth that quantifies the sharpness of the transition between two adjacent crystalline layers by measuring the extent to which compositional or structural changes occur over an atomic-scale distance, distinguishing it from gradual or diffuse interfacial profiles.

141

Publications

8.1K

Citations

587

Authors

202

Institutions

Publications per year

2017–2026

7

Authors

587

  1. GP
    G. Patriarche

    Centre National de la Recherche Scientifique, France

    3 publications · 124 citations

    3

    h-index

  2. DA
    David A. Muller

    Cornell University, United States

    3 publications · 1.7K citations

    3

    h-index

  3. AO
    A. Ourmazd

    AT&T (United States), United States

    3 publications · 218 citations

    3

    h-index

  4. DG
    Darrell G. Schlom

    Cornell University, United States

    2 publications · 247 citations

    2

    h-index

  5. SJ
    S. J. Pearton

    University of Florida, United States

    2 publications · 44 citations

    2

    h-index

1–5 of 587

Venues

  1. Applied Physics Letters

    24 publications · 1.2K citations

    19

    h-index

  2. Journal of Applied Physics

    13 publications · 237 citations

    11

    h-index

  3. Journal of Crystal Growth

    13 publications · 462 citations

    11

    h-index

  4. Nano Letters

    6 publications · 340 citations

    6

    h-index

  5. Physical Review Letters

    PRL · 5 publications · 365 citations

    5

    h-index

1–5