Interface Abruptness
Interface Abruptness is a metric in epitaxial growth that quantifies the sharpness of the transition between two adjacent crystalline layers by measuring the extent to which compositional or structural changes occur over an atomic-scale distance, distinguishing it from gradual or diffuse interfacial profiles.
141
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8.1K
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587
Authors
202
Institutions
Publications per year
2017–2026
7
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141
Why some interfaces cannot be sharp
Naoyuki Nakagawa, Harold Y. Hwang, David A. Muller · Nature Materials · 2006 · 1.5K citations · Full text
Natural Sciences, Materials Engineering, Materials Science +10
The growth of rough surfaces and interfaces
Paul Meakin · Physics Reports · 1993 · 416 citations
Natural Sciences, Materials Engineering, Materials Science +12
Interface defects, reference spaces and the Frank–Bilby equation
J. P. Hirth, R.C. Pond, R.G. Hoagland et al. · Progress in Materials Science · 2012 · 237 citations
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202

Centre National de la Recherche Scientifique
Paris, France
9 h-index
46 publications
1.4K citations
AT&T (United States)
Bedminster, United States
7 h-index
29 publications
1.7K citations
The University of Tokyo
Tokyo, Japan
5 h-index
18 publications
3.4K citations
University of Illinois Urbana-Champaign
Urbana, United States
4 h-index
18 publications
255 citations
University of Michigan
Ann Arbor, United States
3 h-index
9 publications
480 citations

National Laboratory of the Rockies
Golden, United States
3 h-index
5 publications
188 citations
University of Oxford
Oxford, United Kingdom
3 h-index
9 publications
1.1K citations
Paul Drude Institute for Solid State Electronics
Berlin, Germany
3 h-index
15 publications
346 citations
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24 publications · 1.2K citations
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13 publications · 237 citations
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13 publications · 462 citations
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6 publications · 340 citations
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PRL · 5 publications · 365 citations
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