Intensity I-v Analysis

Intensity I-V Analysis is a specialized experimental methodology in surface science that distinguishes itself by quantifying the variation of diffracted electron beam intensity as a function of incident electron energy to determine atomic-scale structural characteristics of crystalline surfaces.

35

Publications

1.4K

Citations

97

Authors

33

Institutions

Publications per year

2017–2026

1

Variants

I-v LeedLeed I-v Analysis

Authors

97

  1. JR
    J. R. Noonan

    Oak Ridge National Laboratory, United States

    5 publications · 256 citations

    5

    h-index

  2. DA
    David A. King

    University of Cambridge, United Kingdom

    3 publications · 65 citations

    3

    h-index

  3. MV
    M.A. Van Hove

    Lawrence Berkeley National Laboratory, United States

    3 publications · 91 citations

    3

    h-index

  4. HL
    H. L. Davis

    Oak Ridge National Laboratory, United States

    3 publications · 135 citations

    3

    h-index

  5. HL
    H. L. Davis

    Oak Ridge National Laboratory, United States

    2 publications · 121 citations

    2

    h-index

1–5 of 97

Venues

  1. Physical review. B, Condensed matter

    PRB · 8 publications · 327 citations

    8

    h-index

  2. Journal of Vacuum Science and Technology

    6 publications · 307 citations

    6

    h-index

  3. Journal of Physics C Solid State Physics

    3 publications · 65 citations

    3

    h-index

  4. Solid-State Electronics

    3 publications · 330 citations

    3

    h-index

  5. Surface Science

    2 publications · 84 citations

    2

    h-index

1–5