Few-shot Defect Detection
Few-Shot Defect Detection is a defect detection paradigm that belongs to the class of machine learning approaches in which a model identifies anomalies or defects in new categories by learning from a very limited number of labeled defective instances, distinguishing itself through its reliance on minimal supervision compared to conventional defect detection methods requiring large annotated datasets.
31
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1.5K
Citations
119
Authors
38
Institutions
Publications per year
2017–2026
30
Parents
31
Vehicle defect discovery from social media
Alan S. Abrahams, Jian Jiao, G. Alan Wang et al. · Decision Support Systems · 2012 · 245 citations
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38

Northeastern University
Shenyang, China
6 h-index
25 publications
1.1K citations

Xi'an Jiaotong University
Xi'an, China
3 h-index
7 publications
186 citations

Zhejiang University
Hangzhou, China
3 h-index
12 publications
333 citations

Chinese Academy of Sciences
Beijing, China
2 h-index
8 publications
278 citations
University of Chinese Academy of Sciences
Beijing, China
2 h-index
2 publications
66 citations

Taiyuan University of Technology
Taiyuan, China
2 h-index
6 publications
164 citations
University of Ulster
Coleraine, United Kingdom
2 h-index
4 publications
100 citations

Guizhou University
Guiyang, China
1 h-index
1 publications
40 citations
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4 publications · 193 citations
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3 publications · 102 citations
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2 publications · 58 citations
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CACAIE · 2 publications · 160 citations
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2 publications · 84 citations
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