Feature Detection

Feature Detection is a computational process in which distinctive and salient patterns or structures are identified within visual, spectral, or sensor-derived data to enable higher-level analysis, distinguishing itself by focusing on the localization and characterization of informative elements relevant to interpretation in domains such as Computer Vision, Metabolomics, and Robot Vision.

22K

Publications

1.7M

Citations

57.2K

Authors

6.7K

Institutions

Publications per year

2017–2026

10.5K

Authors

57.2K

  1. DZ
    David Zhang

    Hong Kong Polytechnic University, Hong Kong SAR China

    60 publications · 7.1K citations

    38

    h-index

  2. HL
    Huchuan Lu

    Dalian University of Technology, China

    48 publications · 7.7K citations

    32

    h-index

  3. AK
    Anil K. Jain

    Michigan State University, United States

    28 publications · 6.6K citations

    26

    h-index

  4. MC
    Ming‐Ming Cheng

    Nankai University, China

    25 publications · 15.2K citations

    23

    h-index

  5. LZ
    Lei Zhang

    Hong Kong Polytechnic University, Hong Kong SAR China

    30 publications · 3.4K citations

    23

    h-index

1–5 of 57.2K

Venues

  1. IEEE Transactions on Pattern Analysis and Machine Intelligence

    TPAMI · 254 publications · 122.1K citations

    127

    h-index

  2. IEEE Transactions on Image Processing

    290 publications · 29.4K citations

    91

    h-index

  3. Pattern Recognition

    380 publications · 36K citations

    90

    h-index

  4. IEEE Access

    585 publications · 28K citations

    82

    h-index

  5. IEEE Transactions on Geoscience and Remote Sensing

    234 publications · 21.2K citations

    81

    h-index

1–5