Entropy Source Characterization
Entropy Source Characterization is a methodological framework in the field of hardware security that identifies and quantifies the intrinsic randomness and unpredictability of physical variations in a Physical Unclonable Function to distinguish it from other sources of noise or deterministic behavior.
45
Publications
1.3K
Citations
154
Authors
64
Institutions
Publications per year
2017–2026
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Data Assurance and Communication Security
Beijing, China
3 h-index
11 publications
243 citations
Institute of Information Engineering
Beijing, China
3 h-index
11 publications
243 citations
KU Leuven
Leuven, Belgium
3 h-index
15 publications
280 citations
Techniques of Informatics and Microelectronics for Integrated Systems Architecture
Grenoble, France
2 h-index
2 publications
36 citations

Harvard University Press
Cambridge, United States
2 h-index
2 publications
160 citations

Pennsylvania State University
State College, United States
2 h-index
2 publications
52 citations
University of Maryland, College Park
College Park, United States
2 h-index
5 publications
251 citations
University of Chinese Academy of Sciences
Beijing, China
2 h-index
8 publications
204 citations
1–8 of 64
Repository · 2 publications · 33 citations
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2 publications · 46 citations
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3 publications · 73 citations
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1 publications · 21 citations
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Repository · 1 publications · 133 citations
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