Entropy Source Characterization

Entropy Source Characterization is a methodological framework in the field of hardware security that identifies and quantifies the intrinsic randomness and unpredictability of physical variations in a Physical Unclonable Function to distinguish it from other sources of noise or deterministic behavior.

45

Publications

1.3K

Citations

154

Authors

64

Institutions

Publications per year

2017–2026

26

Authors

154

  1. JL
    Jingqiang Lin

    Institute of Information Engineering, China

    3 publications · 60 citations

    3

    h-index

  2. VR
    Vladimir Rožić

    KU Leuven, Belgium

    3 publications · 56 citations

    3

    h-index

  3. JJ
    Jiwu Jing

    Chinese Academy of Sciences, China

    3 publications · 60 citations

    3

    h-index

  4. YM
    Yuan Ma

    University of Chinese Academy of Sciences, China

    3 publications · 60 citations

    3

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  5. SZ
    Shuangyi Zhu

    Data Assurance and Communication Security, China

    3 publications · 60 citations

    3

    h-index

1–5 of 154

Venues

  1. HAL (Le Centre pour la Communication Scientifique Directe)

    Repository · 2 publications · 33 citations

    2

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  2. Entropy

    2 publications · 46 citations

    2

    h-index

  3. Optics Express

    3 publications · 73 citations

    2

    h-index

  4. 1

    h-index

  5. 1

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1–5