Electronic Property Modification

Electronic Property Modification is a systematic process in thin film annealing research that alters the electrical conductivity, carrier concentration, or band structure of a material through controlled thermal treatment, thereby distinguishing it from other property modifications by its specific focus on enhancing or tuning electronic behavior for semiconductor, optoelectronic, or electronic device applications.

132

Publications

5.8K

Citations

690

Authors

262

Institutions

Publications per year

2017–2026

73

Authors

690

  1. LW
    Lingrui Wang

    Zhengzhou University, China

    3 publications · 270 citations

    3

    h-index

  2. CL
    Chunming Liu

    Chinese Academy of Sciences, China

    2 publications · 252 citations

    2

    h-index

  3. BZ
    Bo Zou

    Jilin University, China

    2 publications · 252 citations

    2

    h-index

  4. NI
    Noriaki Itoh

    Nagoya University, Japan

    2 publications · 57 citations

    2

    h-index

  5. LZ
    Long Zhang

    Jilin University, China

    2 publications · 252 citations

    2

    h-index

1–5 of 690

Venues

  1. Journal of Applied Physics

    6 publications · 149 citations

    6

    h-index

  2. Applied Physics Letters

    4 publications · 121 citations

    4

    h-index

  3. Applied Surface Science

    4 publications · 89 citations

    4

    h-index

  4. Chemical Engineering Journal

    4 publications · 243 citations

    4

    h-index

  5. RSC Advances

    4 publications · 132 citations

    4

    h-index

1–5