Device Longevity Assessment is a methodological framework within the field of device maintenance that systematically evaluates the expected operational lifespan of a device by analyzing its usage patterns, environmental stressors, and component degradation mechanisms to predict end-of-life thresholds and optimize maintenance schedules.
162
Publications
7.3K
Citations
722
Authors
319
Institutions
Publications per year
2017–2026
44
Parents
Publications
162
1–5 of 162
Authors
722
- GB
8
h-index
- MB
7
h-index
- MZ
5
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- NN
4
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- MB
4
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1–5 of 722
Institutions
319
University of Bologna
Bologna, Italy
9 h-index
44 publications
1.4K citations
IRCCS Azienda Ospedliero-Universitaria di Bologna Policlinico di Sant'Orsola
Bologna, Italy
7 h-index
22 publications
994 citations
Centre National de la Recherche Scientifique
Paris, France
5 h-index
18 publications
368 citations
Medtronic (United States)
Minneapolis, United States
5 h-index
7 publications
395 citations
Rensselaer Polytechnic Institute
Troy, United States
4 h-index
11 publications
1.7K citations
Infineon Technologies (Germany)
Munich, Germany
4 h-index
11 publications
1.2K citations
IMEC
Leuven, Belgium
4 h-index
23 publications
619 citations
Technical University of Denmark
Kongens Lyngby, Denmark
3 h-index
23 publications
1.8K citations
1–8 of 319
Venues
- Pacing and Clinical Electrophysiology
PACE · 14 publications · 308 citations
12
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- EP Europace
9 publications · 315 citations
9
h-index
- IEEE Transactions on Electron Devices
6 publications · 163 citations
6
h-index
- Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
5 publications · 187 citations
5
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- IEEE Transactions on Device and Materials Reliability
4 publications · 246 citations
4
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1–5