Device Contamination

Device Contamination is an academic concept referring to the unintended influence or alteration of device performance, data integrity, or experimental outcomes due to the presence of extraneous biological, chemical, or particulate substances introduced during manufacturing, handling, or operational use.

43

Publications

1.1K

Citations

167

Authors

80

Institutions

Publications per year

2017–2026

7

Authors

167

  1. DD
    David D. Tuschel

    Kodak (United States), United States

    1 publications · 18 citations

    1

    h-index

  2. SL
    Søren Lundbye‐Christensen

    Aalborg University Hospital, Denmark

    1 publications · 14 citations

    1

    h-index

  3. HM
    Huijie Miao

    Stony Brook University, United States

    1 publications · 19 citations

    1

    h-index

  4. TR
    Timothy R. Wolfe

    University of Utah, United States

    1 publications · 14 citations

    1

    h-index

  5. ZZ
    Zhirou Zhang

    Beijing Normal University, China

    1 publications · 21 citations

    1

    h-index

1–5 of 167

Venues

  1. Microelectronics Reliability

    4 publications · 99 citations

    4

    h-index

  2. 2

    h-index

  3. American Journal of Infection Control

    AJIC · 2 publications · 61 citations

    2

    h-index

  4. Current Microbiology

    1 publications · 18 citations

    1

    h-index

  5. 1

    h-index

1–5