Design For Testability Checking

"Design for Test在玩家中 Checking" is a formal verification process within electronic design automation that ensures a circuit design adheres to specific testability rules and structures—such as scan chains, built-in self-test mechanisms, and fault observability—enabling efficient detection and diagnosis of manufacturing defects, thereby distinguishing it from general design rule checking by focusing exclusively on testability enhancements.

Publications

2.5K

Citations

131

Authors

Institutions

Publications per year

2017–2026

Parents

Design Rule Checking

Publications

Enhancing Testability of Large-Scale Integrated Circuits via Test Points and Additional Logic

Monika Williams, James B. Angell · IEEE Transactions on Computers · 1973 · 303 citations

Engineering, Computer Engineering, Electrical Engineering +13

Proceedings of Design, Automation and Test in Europe (DATE07)

Rudy Lawereins, Jan Madsen · 2007 · 217 citations

Engineering, Computer Engineering, Computer Systems +9

Test program generation for functional verification of PowerPC processors in IBM

Aharon Aharon, Dave Goodman, Moshe Levinger et al. · 1995 · 165 citations

Computing, Computer Engineering, Computer Science +16

Current signatures: application

Anne Gattiker, W. Maly · 2002 · 117 citations

Engineering, Computer Engineering, Electrical Engineering +15

DATE '08 Proceedings of the conference on Design, automation and test in Europe

Timothy W. Jones, Sandro Bartolini, Bruno De Bus et al. · ACM eBooks · 2008 · 113 citations

Engineering, Computer Engineering, Computer Systems +9

1–5 of 57

Authors

131

FA
Frederik Arbeiter
Karlsruhe Institute of Technology, Germany
3 publications · 44 citations
3
h-index
WM
W. Maly
Carnegie Mellon University, United States
2 publications · 142 citations
2
h-index
AG
Anne Gattiker
IBM Research - Austin, United States
2 publications · 142 citations
2
h-index
JJ
Jawahar Jain
Fujitsu (United States), United States
2 publications · 96 citations
2
h-index
ML
Moshe Levinger
IBM Research - Haifa, Israel
2 publications · 213 citations
2
h-index

1–5 of 131

Institutions

1–8 of 56

Venues

Design Automation Conference
Conference · 4 publications · 92 citations
4
h-index
IEEE Design & Test of Computers
4 publications · 162 citations
4
h-index
Fusion Engineering and Design
3 publications · 44 citations
3
h-index
IEEE Transactions on Computers
3 publications · 445 citations
3
h-index
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
3 publications · 156 citations
3
h-index

1–5