Catastrophic failure and fault-tolerant design of IGBT power electronic converters - an overview

Rui Wu, Frede Blaabjerg, Huai Wang, +2

ReliabilityElectrical EngineeringReliability EngineeringEngineeringPower Electronic Converters +11

A Temperature-Dependent Thermal Model of IGBT Modules Suitable for Circuit-Level Simulations

Rui Wu, Huai Wang, Kristian Bonderup Pedersen, +4

IEEE Transactions on Industry Applications

Comprehensive investigation on current imbalance among parallel chips inside MW-scale IGBT power modules

Rui Wu, Liudmila Smirnova, Huai Wang, +2

Electrical EngineeringCurrent ImbalanceEngineeringPower IcPower Device +8

Parasitic Capacitive Couplings in Medium Voltage Power Electronic Systems: An Overview

Benjamin Futtrup Kjærsgaard, Gao Liu, Morten Rahr Nielsen, +11

IEEE Transactions on Power Electronics

Design for reliability in power electronics in renewable energy systems – status and future

Huai Wang, Frede Blaabjerg, Ke Ma, +1

Overview of catastrophic failures of freewheeling diodes in power electronic circuits

Rui Wu, Frede Blaabjerg, Huai Wang, +1

Microelectronics Reliability

Electrical EngineeringEngineeringHardware ReliabilityPower DevicePower Electronic Circuits +4

A temperature-dependent thermal model of IGBT modules suitable for circuit-level simulations

Rui Wu, Huai Wang, Ke Ma, +3

EngineeringIgbt ModulesIgbt ModulePower ElectronicsThermal Conductivity +15

Accelerated Degradation Testing and Failure Mechanism Analysis of Metallized Film Capacitors for AC Filtering

Bo Yao, Xing Wei, Yichi Zhang, +6

IEEE Transactions on Power Electronics

Fast and Accurate Icepak-PSpice Co-Simulation of IGBTs under Short-Circuit with an Advanced PSpice Model

Rui Wu, Frede Blaabjerg, Francesco Iannuzzo, +1

EngineeringIgbt ModulePower ElectronicsIgbt GeometryAccurate Icepak-pspice Co-simulation +14

Robustness of MW-Level IGBT modules against gate oscillations under short circuit events

Paula Diaz Reigosa, Rui Wu, Francesco Iannuzzo, +1

Microelectronics Reliability

Low-power ElectronicsElectrical EngineeringEngineeringMw-level Igbt ModulesBias Temperature Instability +6